Analytical Lab Equipment
JEOL JSM6010-LA
Scanning Electron Microscope (SEM)
JEOL JSM6010-LA Scanning Electron Microscope (SEM)
Provides high-resolution images and videos of specimens. Features Energy Dispersion Spectroscopy (EDS) allowing semi-quantitative analysis of specimen.
Size Restrictions
- Samples should fit on a singular mount. Sample mount sizes available follow:
- 9 mm
- 30 mm
- 50 mm
- Eight, 9 mm mounts can be sputter coated at once, and four to eight mounts (stub or pin, respectively) can be viewed in one run of the SEM.
- Height limitations: 40 mm restriction
- Samples are best viewed if under 10 mm and smaller
- The stage can only be dropped to 45; allowing for a better field of view for a sample, but only to a certain extent.
Types of Analyses
- Elemental Analysis
- Samples with a flat and smooth surface work the best.
- Thin sections should be sputter coated with carbon, in addition to making a contact from the thin section to the holder with carbon or silver conductive paint. This will not hinder your ability to view the thin sections under the petrographic microscope.
- Wet Samples
- Limited to 15 microliters of fluid in the capsule.
- Items that will easily attach to a membrane will work best: cell, biofilm cultures, etc.
- NOT CURRENTLY AN OPTION
- Biological Samples
- Samples must not require a wet mount.
- Size limitations will be the same as non-biological samples.
- Additional preparation methods to be discussed on a sample-by-sample basis.
- Powdered Samples
- Powders must be affixed to a sample mount.
- “Loose” powders such as rust on a nail is not acceptable as it will coat and contaminate the inside of the SEM. Rust itself adhered to a stub is acceptable.
Denton Vacuum Desk V Sputter Coater
and Carbon Accessory
- Used to coat SEM samples in Gold, Gold-Palladium, and Carbon. Strictly for SEM sample preparation. Gold, Gold-Palladium, and Carbon. Any specimens to undergo EDS analyses should be coated with Carbon and handled with extra care to prevent contamination.
Thermo Scientific ARL Perform’X Sequential
X-Ray Fluorescence (XRF)
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- Provides quantitative information of a specimen. No powdered or liquid samples.
- Used for investigating crystal structures.
Bruker D2 Phaser X-Ray Diffractometer
- Provides quantitative analysis of a powdered specimen.
Nikon SMZ745T CH Zoom Stereo Microscope
- Stereoscopic microscope with built in illumination from above and below. Additional gooseneck LED lights for optimal working conditions.
Nikon E200 Polarizing Microscope
- Polarizing microscope with plain and cross-polarized light for petrographic analyses. Add on feature of objective lens marker for marking a point of interest on specimen.
Practum Balance by Sartorius Corporation
- Precision balance used for weighing in a calibrated environment.
- Maximum of 220 grams.