Analytical Lab Equipment

Analytical Lab

JEOL JSM6010-LA 
Scanning Electron Microscope (SEM)

JEOL JSM6010-LA Scanning Electron Microscope (SEM)

Provides high-resolution images and videos of specimens. Features Energy Dispersion Spectroscopy (EDS) allowing semi-quantitative analysis of specimen.

Size Restrictions

  • Samples should fit on a singular mount. Sample mount sizes available follow:
    • 9 mm
    • 30 mm
    • 50 mm
  • Eight, 9 mm mounts can be sputter coated at once, and four to eight mounts (stub or pin, respectively) can be viewed in one run of the SEM.
  • Height limitations: 40 mm restriction
    • Samples are best viewed if under 10 mm and smaller
    • The stage can only be dropped to 45; allowing for a better field of view for a sample, but only to a certain extent.

Types of Analyses

  • Elemental Analysis
    • Samples with a flat and smooth surface work the best.
    • Thin sections should be sputter coated with carbon, in addition to making a contact from the thin section to the holder with carbon or silver conductive paint. This will not hinder your ability to view the thin sections under the petrographic microscope.
  • Wet Samples
    • Limited to 15 microliters of fluid in the capsule.
    • Items that will easily attach to a membrane will work best: cell, biofilm cultures, etc.
    • NOT CURRENTLY AN OPTION
  • Biological Samples
    • Samples must not require a wet mount.
    • Size limitations will be the same as non-biological samples.
    • Additional preparation methods to be discussed on a sample-by-sample basis.
  • Powdered Samples
    • Powders must be affixed to a sample mount.
    • “Loose” powders such as rust on a nail is not acceptable as it will coat and contaminate the inside of the SEM. Rust itself adhered to a stub is acceptable.

Denton Vacuum Desk V Sputter Coater
and Carbon Accessory

  • Used to coat SEM samples in Gold, Gold-Palladium, and Carbon. Strictly for SEM sample preparation. Gold, Gold-Palladium, and Carbon. Any specimens to undergo EDS analyses should be coated with Carbon and handled with extra care to prevent contamination.

Thermo Scientific ARL Perform’X Sequential
X-Ray Fluorescence (XRF)

  • Provides quantitative information of a specimen. No powdered or liquid samples.
  • Used for investigating crystal structures.

Bruker D2 Phaser X-Ray Diffractometer

  • Provides quantitative analysis of a powdered specimen.

Nikon SMZ745T CH Zoom Stereo Microscope

  • Stereoscopic microscope with built in illumination from above and below. Additional gooseneck LED lights for optimal working conditions.

Nikon E200 Polarizing Microscope

  • Polarizing microscope with plain and cross-polarized light for petrographic analyses. Add on feature of objective lens marker for marking a point of interest on specimen.

Practum Balance by Sartorius Corporation

  • Precision balance used for weighing in a calibrated environment.
  • Maximum of 220 grams.